YADAV, A. B. . GEN AI-DRIVEN ELECTRONICS: INNOVATIONS, CHALLENGES AND FUTURE PROSPECTS. International Congress on Models and methods in Modern Investigations, [S. l.], p. 113–121, 2023. Disponível em: https://conferenceseries.info/index.php/congress/article/view/1609. Acesso em: 4 dec. 2024.